Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces Sascha Sadewasser

ISBN: 9783642225659

Published: October 22nd 2011

Hardcover

334 pages


Description

Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces  by  Sascha Sadewasser

Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces by Sascha Sadewasser
October 22nd 2011 | Hardcover | PDF, EPUB, FB2, DjVu, talking book, mp3, ZIP | 334 pages | ISBN: 9783642225659 | 9.33 Mb

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. SurfaceMoreOver the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.



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